Publications of 2013
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Journal Articles (1)
- Leuthold, J.; Hoessbacher, C.; Muehlbrandt, S.; Melikyan, A.; Kohl, M.; Koos, C.; Freude, W.; Dolores-Calzadilla, V.; Smit, M.; Suarez, I.; Martinez-Pastor, J. P.; Fitrakis, E. P.; Tomkos, I.
Plasmonic Communications: Light on a Wire
Opt. Photon. News 24, 28--35 (2013) [DOI]
Conference Contributions (2)
- Freude, W.; Alloatti, L.; Korn, D.; Lauermann, M.; Melikyan, A.; Palmer, R.; Pfeifle, J.; Schindler, P. C.; Weimann, C.; Dinu, R.; Bolten, J.; Wahlbrink, T.; Waldow, M.; Walheim, S.; Leufke, P. M.; Ulrich, S.; Ye, J.; Vincze, P.; Hahn, H.; Yu, H.; Bogaerts, W.; Brasch, V.; Herr, T.; Holzwarth, R.; Hartinger, K.; Stamatiadis, C.; O'Keefe, M.; Stampoulidis, L.; Zimmermann, L.; Baets, R.; Schimmel, T.; Tomkos, I.; Petermann, K.; Kippenberg, T. J.; Koos, C.; Leuthold, J.
Nonlinear Nano-Photonics
Frontiers in Optics (FiO'13), Orlando (FL), USA, Oct. 05-10 , paper FTu4C.6 Optical Society of America (OSA) (2013) [DOI] (invited) - Melikyan, A.; Alloatti, L.; Muslija, A.; Hillerkuss, D.; Schindler, P. C.; Li, J.; Palmer, R.; Korn, D.; Muehlbrandt, S.; Thourhout, D. V.; Chen, B.; Dinu, R.; Sommer, M.; Koos, C.; Kohl, M.; Freude, W.; Leuthold, J.
Surface Plasmon Polariton High-Speed Modulator
Conf. on Lasers and Electro-Optics (CLEO'13), San Jose (CA), USA, June 9–14 , paper CTh5D.2 Optical Society of America (2013) [DOI] (postdeadline)
Workshops (1)
- Freude, W.; Alloatti, L.; Melikyan, A.; Palmer, R.; Korn, D.; Pfeifle, J.; Weimann, C.; Koeber, S.; Barklund, A.; Dinu, R.; Wieland, J.; Fournier, M.; Fedeli, J.-M.; Bolten, J.; Wahlbrink, T.; Waldow, M.; Walheim, S.; Leufke, P. M.; Ulrich, S.; Ye, J.; Vincze, P.; Hahn, H.; Yu, H.; Bogaerts, W.; Dumon, P.; Breiten, B.; Diederich, F.; Beels, M. T.; Biaggio, I.; Hartinger, K.; Brasch, V.; Herr, T.; Holzwarth, R.; Baets, R.; Schimmel, T.; Kippenberg, T. J.; Koos, C.; Leuthold, J.
Nonlinear nanophotonic devices
Seminar on Optical, Electronic and Quantum Systems, JILA at University of Colorado and National Institute of Standards and Technology (NIST), March 15 , Boulder, USA (2013) (invited)