Journal Articles (3)

• Schneider, S.; Eppler, F.; Weber, M.; Olowojoba, G.; Weiss, P.; Hubner, C.; Mikonsaari, I.; Freude, W.; Koos, C.
  Multiscale dispersion-state characterization of nanocomposites using optical coherence tomography
  Scientific Reports 6, 31733 (2016) [DOI]


• Schneider, S.; Lauermann, M.; Dietrich, P.-I.; Weimann, C.; Freude, W.; Koos, C.
  Optical coherence tomography system mass-producible on a silicon photonic chip
  Opt. Express 24, 1573-1586 (2016) [DOI]


• Cleary, C. S.; Power, M. J.; Schneider, S.; Webb, R. P.; Manning, R. J.
  Fast gain recovery rates with strong wavelength dependence in a non-linear SOA
  Opt. Express 18, 25726--25737 (2010) [DOI]

Conference Contributions (5)

• Koos, C.; Freude, W.; Guber, A. E.; Schimmel, T.; Lauermann, M.; Schneider, S.; Weimann, C.; Muehlbrandt, S.; Harter, T.; Wondimu, S. F.; Wienhold, T.; von der Ecken, S.; Dietrich, P.-I.; Goering, G.
  Photonic Integration for Metrology and Sensing
  OSA Integrated Photonics Research, Silicon, and Nano- Photonics (IPR), New Orleans, Louisiana, USA, 24 - 27 July , paper ITh1A.1. (2017) [DOI] (invited)


• Freude, W.; Schneider, S.; Lauermann, M.; Dietrich, P.-I.; Weimann, C.; Koos, C.
  Silicon photonic integrated circuit for optical coherence tomography
  18th Intern. Conf. on Transparent Optical Networks (ICTON'16), Trento, Italy, July 10-14 , paper Tu.C5.1 (2016) [DOI] (invited)


• Dietrich, P.-I.; Reuter, I.; Blaicher, M.; Schneider, S.; Billah, M. R.; Hoose, T.; Hofmann, A.; Caer, C.; Dangel, R.; Offrein, B.; Moehrle, M.; Troppenz, U.; Zander, M.; Freude, W.; Koos, C.
  Lenses for Low-Loss Chip-to-Fiber and Fiber-to-Fiber Coupling Fabricated by 3D Direct-Write Lithography
  Conf. on Lasers and Electro-Optics (CLEO'16), San Jose (CA), USA, June 5 – 10 , paper SM1G.4. (2016) [DOI]


• Schneider, S.; Lauermann, M.; Weimann, C.; Freude, W.; Koos, C.
  Silicon Photonic Optical Coherence Tomography System
  Conference on Lasers and Electro-Optics (CLEO'14), Symposium on Novel Light Sources and Photonic Devices in Optical Imaging I, San Jose (CA), USA, June 8–13 , paper ATu2P.4 Optical Society of America (OSA) (2014) [DOI]


• Schneider, S.; Kramer, A.; Eppler, F.; Alemye, H.; Hubner, C.; Mikonsaari, I.; Leuthold, J.; Freude, W.; Koos, C.
  Polarization-Sensitive Optical Coherence Tomography for Characterization of Size and Shape of Nano-Particles
  Conf. on Lasers and Electro-Optics (CLEO'13), San Jose (CA), USA, June 9–14 , AF1J.4 Optical Society of America (2013) [DOI]

Lectures (2)

• Freude, W.; Schneider, S.; Weimann, C.; Hoeller, F.; Lauermann, M.; Dietrich, P.-I.; Koos, C.
  Integrated optics for optical coherence tomography and surface topography characterization
  Light: Science & Applications, Light Conference (Light Conference'16, Speakers), Changchun, China, July 4-8 (2016) (invited)


• Schneider, S.; Kramer, A.; Eppler, F.; Alemye, H.; Hubner, C.; Mikonsaari, I.; Freude, W.; Koos, C.
  Polarization-Sensitive Optical Coherence Tomography for Characterization of Size and Shape of Nano-Particles
  115th Annual DGaO Conference (DGaO'14), June 10 - 14, Karlsruhe, Germany (2014)